Aetrium
A leading supplier of Test Handlers and Reliability Test Systems.

• High Speed Gravity Handlers
• Wafer and Device Process Validation Testing - TDDB, Cu/Al EM, HCI and More

Camtek

Providers of intelligent optical inspection systems (AOI) to the Semiconductor Manufacturing and Packaging, IC Substrates, and Printed Circuit Board (PCB) industries. Camtek addresses the specific needs of each industry with dedicated solutions, based on a common core of intelligent imaging technologies.
 

• Condor 100 for surface defects; probe marks 
• Condor 200 for LED, MEMS, Optical & Medical 
• Condor 300 for bumped wafer metrology & TSV
• Condor PD for post wafer dicing
• Gannet series for front end FAB inspection

FTS Systems

Thermal Air Systems

• Cascade refrigeration design – low maintenance
• Floor and bench top models with Full Mil-spec capabilities
• CD and TUV Certified

ITC

Probe Card Analyzers

• No Cable Design
• Full Kelvin
• Full Electrical Test Capability
• I/O Channel Capability 6000+

Test Equipment

• Unclamped Inductive Load Tester & Switch Test Systems
• Transient Voltage Suppressor Surge Tester

Magma

YieldManager® software helps users achieve and maintain high yields by allowing engineers to collect, correlate, analyze, and share critical data. Yield Manager eliminates the need to maintain multiple client-server applications throughout the fab, reducing the cost and complexity of your infrastructure by providing a single robust and industry proven solution.

CAD Navigation solution is Magma’s newest generation product. Camelot® software for failure analysis, design-debug, and low yield analysis optimizes the equipment and personnel resources of design and semiconductor F/A labs by providing computer interfaces and navigation capabilities for more than 50 different types of analysis and test equipment. Its application tools, features, options, and networking capability provide a complete, integrated system for fast and efficient investigation and resolution of inspection, test and analysis jobs.

Phoenix Test Arrays

High Performance Test Sockets

• Non pogo pin solutions
• Bandwidths greater than 40Ghz @ 1dB
• Lead free solutions
• Simple maintenance
• 20 yrs experience

• Design, Reliability, and Failure Analysis
• Surplus & Used Equipment